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Reliability Test Conditions / Precautions

Reliability Test Conditions

Basically the CIG VFD is subjected to the same reliability test standards "TT-90-3050A" as the conventional VFDs. For details on the test conditions, refer to Vacuum Fluorescent Display Application Note APN1O1.

Precautions

  • Since the CIG VFD contains C-MOS chips, please be cautious of electrostatic discharge failure. Unpacking of the CIG VFD from the packing tray, mounting or soldering to the PCBs should be conducted in an environment provided with anti-static measures.
  • When the SO and GSO terminals are not used, please leave them open.
  • Some types of CIG VFDs may come equipped with terminals of the same designation. Those terminals with the same designation should all be connected in parallel.
  • Be careful not to apply the display supply vantage (VDD2) without the logic supply voltage (VDD1). Please refer to the power supply sequence in this application note or individual specification.
  • Insert a noise filtering capacitor between "VDD1 " and "VSS".
  • When powering up the VFD, only illuminate the display when any random data in the driver is removed.
  • To avoid a flickering display, the refresh rate must be 120Hz or higher.
  • The grid scan must be continuous, and never be interrupted while the VFD is operating. If the grid scan is interrupted even momentarily, the VFD may be permanently damaged. See the protection circuit in Fig. 12.

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